In-Volume Silicon Inspection

Our novel IR imaging technology for semiconductor is patent pending worldwide

Our technology, your needs

  • Custom integration for your microscope

    Already have a kick-ass microscope?

    Our technology is compatible with most high-performance microscopes and can be integrated right into it.

    Request a quote 

  • Customized microscope

    Have specific needs?


    Select your desired features, and we'll manufacture a custom-made microscope for high-resolution imaging through silicon to fit your requirements.

    See all the options 

  • Ready to use microscope

    A manual microscope that provides deep silicon imaging for under US$5,000 with superior resolution & real-time inspection.

    In your lab in less than 30 days.

    More info 

Why should you use our technology?

Addressing the needs of chip designers and R&D teams, our technology tackles the long-standing challenge of silicon's opacity in microchip inspection, delivering high definition imaging for each silicon layer, even in tightly stacked configurations. Here's a demo showcasing the impressive capabilities of our microscope, which offers a cost effective alternative to traditional infrared microscopes.

20x

  • Existing technology

  • Our technology

Image of an integrated silicon chip sandwiched between two 500um thick silicon wafers

40x

  • Existing technology

  • Our technology

Image of an integrated silicon chip sandwiched between two 500um thick silicon wafers

100x

  • Existing technology

  • Our technology

Image of an integrated silicon chip sandwiched between two 500um thick silicon wafers

Even more precise

Our technology takes precision to the next level, delivering high-definition imaging of silicon layers with exceptional resolution.

More details

Image of an integrated silicon chip sandwiched between two 500um thick silicon wafers

What experts say about our technology

  • Philippe Lassonde, Research agent, National Institute of Scientific Research

    "This microscope is ideal to observe silicon inside volume. The resolution and contrast of the images are impressive."

  • Steeve Morency, Expert Technician in Glass Materials, Center for Optics, Photonics and Lasers

    "It's truly amazing to see such an affordable microscope delivering superior results compared to our $100,000 microscope!"

  • Mathieu Lebeuf, Test & Characterization Engineer, AEPONYX inc.

    "Jay Photonics' microscope is a compact, user-friendly, competitively priced infrared inspection station with great potential."

  • Antoine Dumont, Field Application Scientist, Telops

    "Very impressive technology!"

  • Philippe Labranche, Engineering Physics Technician, Laval University

    "It's proof that technology can be 'simple' and exceptional at an incredible price!"

1 5

Our latest innovation : Si-Through-HR microscope

The Si-Through-HR Infrared Transmission Microscope

Groundbreaking solution for nondestructive inspection through silicon layers.

  • Deep silicon imaging with superior resolution and high-definition clarity
  • Affordable ready-to-use design
  • Perfect for real-time inspection of silicon chips under microscopes and R&D applications

Upgrade your lab with accessible, cutting edge technology today.

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Microscope add-ons: Enhance your Jay Photonics microscope’s capabilities

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