Subsurface Inspection Through Opaque Semiconductor Materials
Built for engineers working with silicon photonics, MEMS, quantum devices, and other applications (when destructive inspection is not an option).
Our novel IR imaging technology is patent pending worldwide
Our technology, your needs
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Ready to use microscope
More infoA manual microscope that provides deep silicon imaging for under US$5,000 with superior resolution & real-time inspection.
In your lab in less than 30 days. -
Customized microscope
See all the optionsHave specific needs?
Select your desired features, and we'll manufacture a custom-made microscope for high-resolution imaging through silicon to fit your requirements. -
Custom integration for your microscope
Request a quoteAlready have a kick-ass microscope?
Our technology is compatible with most high-performance microscopes and can be integrated right into it.
Why should you use our technology?
Addressing the needs of chip designers and R&D teams, our technology tackles the long-standing challenge of silicon's opacity in microchip inspection, delivering high definition imaging for each silicon layer, even in tightly stacked configurations. Here's a demo showcasing the impressive capabilities of our microscope, which offers a cost effective alternative to traditional infrared microscopes. Images acquired in real time within seconds, with no sample preparation and no image post-processing.
20x
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Existing technology
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Our technology
Image of an integrated silicon chip sandwiched between two 500um thick silicon wafers
40x
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Existing technology
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Our technology
Image of an integrated silicon chip sandwiched between two 500um thick silicon wafers
100x
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Existing technology
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Our technology
Image of an integrated silicon chip sandwiched between two 500um thick silicon wafers
Even more precise
Our technology takes precision to the next level, delivering high-definition imaging of silicon layers with exceptional resolution.
Image of an integrated silicon chip sandwiched between two 500um thick silicon wafers
Our latest innovation : Si-Through-HR microscope
The Si-Through-HR Infrared Transmission Microscope
Groundbreaking solution for nondestructive inspection through silicon layers.
- Deep silicon imaging with superior resolution and high-definition clarity
- Affordable ready-to-use design
- Perfect for real-time inspection of silicon chips under microscopes and R&D applications
Upgrade your lab with accessible, cutting edge technology today.
Some of our clients
Microscope add-ons: Enhance your Jay Photonics microscope’s capabilities
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SWIR polarizers kit for Jay Photonics Si-Through-HR microscope
Regular price $380.00 USDRegular priceUnit price per -
Darkfield condenser (Dry NA 0.7 - 0.9) for Jay Photonics Si-Through-HR microscope
Regular price $570.00 USDRegular priceUnit price per -
Darkfield kit for Jay Photonics Si-Through-HR microscope
Regular price $1,700.00 USDRegular priceUnit price per
What experts say about our technology
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Philippe Lassonde, Research agent, National Institute of Scientific Research
"This microscope is ideal to observe silicon inside volume. The resolution and contrast of the images are impressive."
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Steeve Morency, Expert Technician in Glass Materials, Center for Optics, Photonics and Lasers
"It's truly amazing to see such an affordable microscope delivering superior results compared to our $100,000 microscope!"
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Mathieu Lebeuf, Test & Characterization Engineer, AEPONYX inc.
"Jay Photonics' microscope is a compact, user-friendly, competitively priced infrared inspection station with great potential."
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Antoine Dumont, Field Application Scientist, Telops
"Very impressive technology!"
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Philippe Labranche, Engineering Physics Technician, Laval University
"It's proof that technology can be 'simple' and exceptional at an incredible price!"
