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Full-wafer infrared inspection for detecting bonding voids in silicon wafers
Bonding voids in silicon wafers can significantly impact device reliability and yield. This application note evaluates the use of infrared transmission imaging to detect and visualize these defects across full...
Full-wafer infrared inspection for detecting bonding voids in silicon wafers
Bonding voids in silicon wafers can significantly impact device reliability and yield. This application note evaluates the use of infrared transmission imaging to detect and visualize these defects across full...
Imaging Through Thin Chromium Films Using IR Transmission Microscopy
Thin chromium layers are often considered incompatible with transmission-based optical inspection. This application note explores the practical feasibility and limitations of inspecting underlying structures through chromium-coated glass using infrared microscopy.
Imaging Through Thin Chromium Films Using IR Transmission Microscopy
Thin chromium layers are often considered incompatible with transmission-based optical inspection. This application note explores the practical feasibility and limitations of inspecting underlying structures through chromium-coated glass using infrared microscopy.
Imaging Photonic Grating Couplers Through Silicon
Application note | See how grating couplers and waveguides buried in silicon can be imaged through 1 mm of Si, with side-by-side IR microscope comparisons.
Imaging Photonic Grating Couplers Through Silicon
Application note | See how grating couplers and waveguides buried in silicon can be imaged through 1 mm of Si, with side-by-side IR microscope comparisons.
Imaging Through Germanium: Unlocking High Resolution
Application note | See through 20 µm of Germanium to reveal internal device features, from junctions to complex interconnects, opening new possibilities for R&D and device characterization.
Imaging Through Germanium: Unlocking High Resolution
Application note | See through 20 µm of Germanium to reveal internal device features, from junctions to complex interconnects, opening new possibilities for R&D and device characterization.
Silicon Verniers: Sharper Visualization Using Optimized Infrared Microscopy
Application note | Visualize embedded silicon Verniers with unmatched clarity using Jay Photonics' infrared transmission microscopy. Achieve sub-micron alignment precision.
Silicon Verniers: Sharper Visualization Using Optimized Infrared Microscopy
Application note | Visualize embedded silicon Verniers with unmatched clarity using Jay Photonics' infrared transmission microscopy. Achieve sub-micron alignment precision.
Imaging Through Metal-Coated Silicon
Application note | Uncover how the Jay Photonics microscope images through metal-coated, gold-hyperdoped silicon, challenging IR imaging assumptions.
Imaging Through Metal-Coated Silicon
Application note | Uncover how the Jay Photonics microscope images through metal-coated, gold-hyperdoped silicon, challenging IR imaging assumptions.