Blog
Revealing Buried Waveguide Defects in Stacked Photonic Chips Through Silicon
Application note | Inspect internal photonic circuits through multiple silicon layers and identify localized waveguide discontinuities without destructive sample preparation.
Revealing Buried Waveguide Defects in Stacked Photonic Chips Through Silicon
Application note | Inspect internal photonic circuits through multiple silicon layers and identify localized waveguide discontinuities without destructive sample preparation.
Imaging Internal MEMS Structures Using Infrared Reflection Microscopy
Application note | Explore a practical example of non-destructive MEMS analysis for failure analysis, process development, and device characterization, powered by Jay Photonics' infrared reflection technology.
Imaging Internal MEMS Structures Using Infrared Reflection Microscopy
Application note | Explore a practical example of non-destructive MEMS analysis for failure analysis, process development, and device characterization, powered by Jay Photonics' infrared reflection technology.
Full-Wafer Infrared Inspection For Detecting Bonding Voids In Silicon Wafers
Application note | Improved resolution and defect visibility for bonding void inspection across full silicon wafers using Jay Photonics' technology.
Full-Wafer Infrared Inspection For Detecting Bonding Voids In Silicon Wafers
Application note | Improved resolution and defect visibility for bonding void inspection across full silicon wafers using Jay Photonics' technology.
Imaging Through Thin Chromium Films Using IR Transmission Microscopy
Application note | Although thin chromium layers are often considered incompatible with transmission-based optical inspection, this work evaluates the practical feasibility and limitations of inspecting underlying structures using Jay Photonics' technology.
Imaging Through Thin Chromium Films Using IR Transmission Microscopy
Application note | Although thin chromium layers are often considered incompatible with transmission-based optical inspection, this work evaluates the practical feasibility and limitations of inspecting underlying structures using Jay Photonics' technology.
Imaging Photonic Grating Couplers Through Silicon
Application note | See how grating couplers and waveguides buried in silicon can be imaged through 1 mm of Si, with side-by-side IR microscope comparisons.
Imaging Photonic Grating Couplers Through Silicon
Application note | See how grating couplers and waveguides buried in silicon can be imaged through 1 mm of Si, with side-by-side IR microscope comparisons.
Imaging Through Germanium: Unlocking High Resolution
Application note | See through 20 µm of Germanium to reveal internal device features, from junctions to complex interconnects, opening new possibilities for R&D and device characterization.
Imaging Through Germanium: Unlocking High Resolution
Application note | See through 20 µm of Germanium to reveal internal device features, from junctions to complex interconnects, opening new possibilities for R&D and device characterization.