Jay Photonics is featured in the Winter edition of Vision Spectra with a column titled “Infrared Microscopy for Semiconductor Inspection,” authored by Helene-Sarah Becotte, Ph.D., CEO of Jay Photonics.
The column provides an overview of infrared microscopy approaches used for semiconductor inspection, with a particular focus on nondestructive techniques that enable visibility beyond the surface. As semiconductor architectures continue to evolve toward denser and more three-dimensional designs, the ability to inspect buried structures, alignment features, and internal defects has become increasingly critical across both R&D and manufacturing environments.
In the article, different inspection methods currently used in the industry are discussed and compared, highlighting their respective strengths and limitations. Infrared microscopy is presented as a complementary approach that offers a practical balance between accessibility, resolution, and nondestructive operation, making it relevant for a wide range of applications in semiconductor research and process development.
This contribution reflects Jay Photonics’ ongoing engagement with the semiconductor inspection community and its commitment to advancing practical, accessible inspection solutions. Sharing technical perspectives through industry publications such as Vision Spectra is part of the company’s broader effort to support knowledge exchange and informed decision-making across the ecosystem.
The full column is available in the Winter edition of Vision Spectra and you can read it by clicking here.