News

Meet Jay Photonics at the MEMS & Sensors Technical Congress (MSTC) 2026

Stop by our booth on September 16–17 to discuss your MEMS inspection challenges, see live demonstrations, and evaluate your own samples.

Jay Photonics to Present at the 21st Canadian Semiconductor Science and Technology Conference

Join Jay Photonics at CSSTC 2026 as Elahe Parham presents our latest research on through-silicon imaging for non-destructive inspection of photonic devices.

Jay Photonics Contributes to the Winter Edition of Vision Spectra

The column explores challenges in semiconductor inspection and compares nondestructive approaches. Click to read the full column in Vision Spectra.

Jay Photonics at Photonics North 2025 – Come Visit Us at Booth #6!

Test your silicon chips live at our booth! Discover how our system reveals buried circuits, waveguides, and alignment marks—through full-thickness silicon.

Jay Photonics Partners with Starvoy Technologies to Expand Access to Advanced Silicon Imaging in Canada

New partnership to deliver advanced silicon imaging and in-person demos of our infrared microscopes across Canada.

Jay Photonics Microscope Spotlighted in Nature Photonics Publication

We are proud to share an extraordinary achievement from our co-founder, Jerome Lapointe, whose groundbreaking research has been featured in Nature Photonics! This publication marks a significant milestone in the field...